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X-ray spectroscopy
CHARACTERIZATION TECHNIQUE
Photon-in-photon-out; X-Ray Spectroscopy; X-ray spectrometry; X-ray spectra; X-Ray Absorption Edge Spectroscopy; X-Ray Absorption Fine Structure Spectroscopy; X-Ray Transmittance Spectroscopy; X-Ray Line Spectrum; X-ray spectrometer; Roentgen spectroscopy; X-ray spectrum; X-ray Spectrometry; Roentgen spectrometry; X-ray spectrograph; X-Ray Spectrometry
X-ray spectroscopy is a general term for several spectroscopic techniques for characterization of materials by using x-ray radiation.
X-ray emission spectroscopy
X-ray emission spectroscopy (XES) is a form of X-ray spectroscopy in which the X-ray line spectra are measured with a spectral resolution sufficient to analyze the impact of the chemical environment on the X-ray line energy and on branching ratios.
X-ray photoelectron spectroscopy
A SURFACE-SENSITIVE QUANTITATIVE SPECTROSCOPIC TECHNIQUE THAT MEASURES THE ELEMENTAL COMPOSITION AT THE PARTS PER THOUSAND RANGE, EMPIRICAL FORMULA, CHEMICAL STATE AND ELECTRONIC STATE OF THE ELEMENTS THAT EXIST WITHIN A MATERIAL.
ESCA; X-ray photoemission spectroscopy; X-ray photoelectron emission microscopy; X-ray photoelectron; X-ray-photoelectron-spectroscopy; X-ray photoelectron spectrum; Electron spectroscopy for chemical analysis
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.
