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Τι (ποιος) είναι ion beam - ορισμός
BEAM OF CHARGED ATOMS (IONS)
Ion beam etching; Ion ray
![[[Nanofluidics]] channels fabricated with a Zeiss Crossbeam 550 L, in a silicon master stamp](https://commons.wikimedia.org/wiki/Special:FilePath/Nanofluidics channels (33411553986).jpg?width=200 "[[Nanofluidics]] channels fabricated with a Zeiss Crossbeam 550 L, in a silicon master stamp")
![field emission scanning electron microscope]] (FE-SEM) with a focused ion beam (FIB).](https://commons.wikimedia.org/wiki/Special:FilePath/ZEISS Crossbeam 550- Your FIB-SEM for High Throughput 3D Analysis and Sample Preparation (33411552526).jpg?width=200 "field emission scanning electron microscope]] (FE-SEM) with a focused ion beam (FIB).")
Focused ion beam
![TEM sample prepared using a FIB, shown at different length scales. The two left images show the sample imaged using secondary electrons acquired on the FIB which prepared the sample. The right image showing the sample imaged using atomic resolution [[scanning transmission electron microscopy]].](https://commons.wikimedia.org/wiki/Special:FilePath/Fib sample preparation tem.jpg?width=200 "TEM sample prepared using a FIB, shown at different length scales. The two left images show the sample imaged using secondary electrons acquired on the FIB which prepared the sample. The right image showing the sample imaged using atomic resolution [[scanning transmission electron microscopy]].")
DEVICE
Focussed Ion Beam (FIB); Focussed ion beam
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM).
Ion beam mixing
Ion Beam Mixing
Ion beam mixing is the atomic intermixing and alloying that can occur at the interface separating two different materials during ion irradiation.Ion-solid interactions, Cambridge Solid-State Science series, ch11, p295 It is applied as a process for adhering two multilayers, especially a substrate and deposited surface layer.
Ion beam-assisted deposition
MATERIALS ENGINEERING TECHNIQUE
IBAD; Ion beam assisted deposition
Ion beam assisted deposition or IBAD or IAD (not to be confused with ion beam induced deposition, IBID) is a materials engineering technique which combines ion implantation with simultaneous sputtering or another physical vapor deposition technique. Besides providing independent control of parameters such as ion energy, temperature and arrival rate of atomic species during deposition, this technique is especially useful to create a gradual transition between the substrate material and the deposited film, and for depositing films with less built-in strain than is possible by other techniques.
Βικιπαίδεια
Ion beam
An ion beam is a type of charged particle beam consisting of ions. Ion beams have many uses in electronics manufacturing (principally ion implantation) and other industries. A variety of ion beam sources exists, some derived from the mercury vapor thrusters developed by NASA in the 1960s. The most common ion beams are of singly-charged ions.
Παραδείγματα από το σώμα κειμένου για ion beam
1. The flag and its pole were cut using an ion beam –– a microscopic version of a laser –– and lifted to a standing position by a nano manipulator.
2. Every piece of Scintilla Monaco jewelry contains diamonds that come with a mark of excellence, which is created with a «unique ion–beam» technology. «This mark is an assurance of the diamond’s exceptional quality and acts as an inimitable security device, allowing authentication even when the diamonds are mounted,» Sathak said, adding that the Scintilla sparkle logo features on most of the jewelry as an integral part of the design. «Every piece of Scintilla Monaco jewelry is made from 18 K nickel–free gold and comes with a hallmark.