scanning densitometer - traduzione in russo
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scanning densitometer - traduzione in russo

BRANCH OF MICROSCOPY
Probe microscopy; Microscopy, scanning probe; Scanning probe microscope; Scanning force microscope; Scanning probe technique

scanning densitometer      
сканирующий денситометр
scanning tunneling microscope         
  • A large STM setup at the [[London Centre for Nanotechnology]]
  • Scanning tunneling microscope operating principle
  • Schematic view of an STM
  • A 1986 STM from the collection of [[Musée d'histoire des sciences de la Ville de Genève]]
  • The real and imaginary parts of the wave function in a rectangular potential barrier model of the scanning tunneling microscope
  • Tip, barrier and sample wave functions in a model of the scanning tunneling microscope. Barrier width is ''w''. Tip bias is ''V''. Surface work functions are ''ϕ''.
  • Negative sample bias ''V'' raises its electronic levels by ''e⋅V''. Only electrons that populate states between the Fermi levels of the sample and the tip are allowed to tunnel.
A MICROSCOPE USED FOR LOOKING AT ATOMS.
Electron tunnel microscopy; Scanning tunneling; Scanning Tunneling Microscope; Scanning tunneling microscopy; Scanning tunnelling microscope; Scanning tunnelling microscopy; Microscopy, scanning tunneling; Scanning-tunneling microscope; Scanning Tunneling Microscopy; STM microscope; Josephson tunneling microscope

общая лексика

растровый [сканирующий] туннельный микроскоп

scanning disk         
IMAGE SCANNING DEVICE
Nipkow disc; Nipkov disk; Nipkov disc; Nipkow scanning disk; Nipkov scanning disk; Nipkov scanning disc; Nipkow scanning disc; Scanning disk

общая лексика

развертывающий диск

Definizione

scanning electron microscope
¦ noun an electron microscope in which the surface of a specimen is scanned by a beam of electrons that are reflected to form an image.

Wikipedia

Scanning probe microscopy

Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level. The first successful scanning tunneling microscope experiment was done by Gerd Binnig and Heinrich Rohrer. The key to their success was using a feedback loop to regulate gap distance between the sample and the probe.

Many scanning probe microscopes can image several interactions simultaneously. The manner of using these interactions to obtain an image is generally called a mode.

The resolution varies somewhat from technique to technique, but some probe techniques reach a rather impressive atomic resolution. This is due largely because piezoelectric actuators can execute motions with a precision and accuracy at the atomic level or better on electronic command. This family of techniques can be called "piezoelectric techniques". The other common denominator is that the data are typically obtained as a two-dimensional grid of data points, visualized in false color as a computer image.

Traduzione di &#39scanning densitometer&#39 in Russo