Kelvin probe force microscope
A NONCONTACT VARIANT OF ATOMIC FORCE MICROSCOPY
Kelvin Probe; Kelvin probe microscopy; Kelvin probe microscope; Kelvin probe force microscopy; Scanning Kelvin probe; Scanning kelvin probe; Scanning Kelvin Probe
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.